Dinatrium-4,4'-(1,10-phenanthrolin-4,7-diyl)bis(benzolsulfonat)

Bezeichnung:Dinatrium-4,4'-(1,10-phenanthrolin-4,7-diyl)bis(benzolsulfonat)

CAS-Nr53744-42-6

Englisch Name:BUFFER SOLUTION

CBNumberCB9340936

SummenformelC24H17N2NaO6S2

Molgewicht516.52

MOL-Datei53744-42-6.mol

Synonyma

Dinatrium-4,4'-(1,10-phenanthrolin-4,7-diyl)bis(benzolsulfonat)

Dinatrium-4,4'-(1,10-phenanthrolin-4,7-diyl)bis(benzolsulfonat) physikalisch-chemischer Eigenschaften

Schmelzpunkt	300 °C
Dichte	1.006 g/mL at 20 °C
Dampfdichte	4.9 (vs air)
storage temp.	Inert atmosphere,Room Temperature
Löslichkeit	H₂O: soluble
Aggregatzustand	Liquid
Farbe	No Color
Expositionsgrenzwerte	ACGIH: TWA 2.5 mg/m3 NIOSH: IDLH 250 mg/m3; TWA 2.5 mg/m3
EPA chemische Informationen	Benzenesulfonic acid, 4,4'-(1,10-phenanthroline-4,7-diyl)bis-, disodium salt (53744-42-6)

Sicherheit

Kennzeichnung gefährlicher	Xi,C
R-Sätze:	36/38-36/37/38-36-52/53-35-67
S-Sätze:	26-36-24/25-37/39-61-45-36/37/39
RIDADR	UN2817
WGK Germany	3
F	8-10
HS Code	2933.99.8210
HazardClass	8
PackingGroup	III

Gefahreninformationscode (GHS)

BUFFER SOLUTION Chemische Eigenschaften,Einsatz,Produktion Methoden

R-Sätze Betriebsanweisung:
R36/38:Reizt die Augen und die Haut.
R36/37/38:Reizt die Augen, die Atmungsorgane und die Haut.
S-Sätze Betriebsanweisung:
S26:Bei Berührung mit den Augen sofort gründlich mit Wasser abspülen und Arzt konsultieren.
S36:DE: Bei der Arbeit geeignete Schutzkleidung tragen.
S24/25:Berührung mit den Augen und der Haut vermeiden.
S37/39:Bei der Arbeit geeignete Schutzhandschuhe und Schutzbrille/Gesichtsschutz tragen.
Verwenden
Used for pretreatment of planar silicon devices when plating with Nickel plating solution products 44069 and 44070.
Verwenden
Use of Buffer HF improved:

Buffer HF improved dissolves silica films (both thermally grown and silane SiO₂) produced on the surfaces of silicon and exposed by photolithography. It also is capable of dissolving doped silica films such as phosphosilica and borosilica glasses as formed in semiconductor processing.
The overall chemical reaction is: 4HF + SiO₂ SiF₄ + 2H₂O
For trouble-free operation Buffer HF improved is recommended in the new technologies for manufacture of semiconductor planar and mesa devices. It is compatible with both negative and positive photoresists. Excellent results with good reproducibility are simple to achieve without undercutting marked oxides, surface staining or device degradation by metallic impurities.
Verwenden
Use of Buffer HF improved:
- Buffer HF improved dissolves silica films (both thermally grown and silane SiO₂) produced on the surfaces of silicon and exposed by photolithography. It also is capable of dissolving doped silica films such as phosphosilica and borosilica glasses as formed in semiconductor processing. The overall chemical reaction is: 4HF + SiO₂ SiF₄ + 2H₂O
- For trouble-free operation Buffer HF improved is recommended in the new technologies for manufacture of semiconductor planar and mesa devices. It is compatible with both negative and positive photoresists. Excellent results with good reproducibility are simple to achieve without undercutting marked oxides, surface staining or device degradation by metallic impurities.
Definition
ChEBI: Disodium 4,7-diphenyl-1,10-phenanthroline 4',4''-disulfonate is an organic sodium salt having 4,7-diphenyl-1,10-phenanthroline 4',4''-disulfonate as the counterion. It has a role as an iron chelator. It contains a 4,7-diphenyl-1,10-phenanthroline 4',4''-disulfonate.
Allgemeine Beschreibung
Improved HF Buffer System with stabilized HF activity - selective solvent for SiO2 used in semiconductor technology of planar passivated devices - transistors, integrated circuits, diodes, rectifiers, SCR, MOS, FET

Advantages:
- Ready-to-use - Economical
- HF activity buffer stabilized
- Excellent process reproducibility
- Does not undercut masked oxide
- Will not stain diffused silicon surfaces
- Avoids contamination on silicon surfaces
- Photoresist coating unaffected
Buffer HF improved is an idealized buffer preparation characterized by a high buffer index and an optimized, uniform oxide-etch rate. The composition of buffer HF improved is precisely controlled by HF activity measurements and electrometric pH. The mass balance corresponds essentially to (HF) + (F) + 2(HF₂) for a two-ligand mononuclear complex and the charge balance is (H⁺) - (F) + (HF^2- ). The HF activity is maintained constant through the specific equilibrium constant which regulates the equilibrium reaction between fluoride, bifluoride, and HF buffer components. A second equilibrium constant participates in the regulation of the hydronium in concentration of pH.

Buffer HF improved is produced and analyzed to be essentially free of impurities. Nitrate ions, a common impurity causing stains on diffused silicon surfaces, are specifically removed. Heavy metal impurities, which can lead to degradation of device characteristics, are rigidly controlled under manufacturing process specifications.

Dinatrium-4,4'-(1,10-phenanthrolin-4,7-diyl)bis(benzolsulfonat) Anbieter Lieferant Produzent Hersteller Vertrieb Händler.

53744-42-6, BUFFER SOLUTION Verwandte Suche:

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